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Raman imaging of stress in a SiGe/Si photoelastic optical channel waveguide structure

Raman imaging of stress in a SiGe/Si photoelastic optical channel waveguide structure

Rho, H.; Jackson, Howard E.; Weiss, B. L.

期刊名称Applied Physics Letters
作者Rho, H.; Jackson, Howard E.; Weiss, B. L.
卷第75卷
期第9期
印刷ISSN0003-6951
文件大小519.72KB
发表时间1999
DOI10.1063/1.124670

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