How much does film sensitivity increase at depth for larger field sizes?
Sykes, Jonathan R.; James, Hayley V.; Williams, Peter C.
- 期刊名称Medical Physics
- 作者Sykes, Jonathan R.; James, Hayley V.; Williams, Peter C.
- 卷第26卷
- 期第2期
- 印刷ISSN0094-2405
- 文件大小321.14KB
- 发表时间1999
- DOI10.1118/1.598520