Ion channeling and x-ray diffraction study of tensely strained GaInP layers on InP
Cohen, G. M.; Ritter, D.; Richter, V.; Kalish, R.
- 期刊名称Applied Physics Letters
- 作者Cohen, G. M.; Ritter, D.; Richter, V.; Kalish, R.
- 卷第74卷
- 期第1期
- 印刷ISSN0003-6951
- 文件大小345.45KB
- 发表时间1999
- DOI10.1063/1.123127