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[IEE IEE Colloquium New Applications in Modelling and Inversion Techniques for Non-Destructive Testing - London, UK (29 Jan. 1999)] IEE Colloquium New Applications in Modelling and Inversion Techniques for Non-Destructive Testing - Modelling the ultrasonic inspection of smooth and rough planar defects

[IEE IEE Colloquium New Applications in Modelling and Inversion Techniques for Non-Destructive Testing - London, UK (29 Jan. 1999)] IEE Colloquium New Applications in Modelling and Inversion Techniques for Non-Destructive Testing - Modelling the ultrasonic inspection of smooth and rough planar defects

Chapman, R.K.

作者Chapman, R.K.
卷第1999卷
文件大小254.52KB
发表时间1999
DOI10.1049/ic:19990106
页码1-1

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