[IEEE 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual - San Diego, CA, USA (23-25 March 1999)] 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) - Reliability evaluation of MOCVD grown AlInAs-GaInAs-InP HEMTs
Nawaz, M.; Strupinski, W.; Stenarson, J.; Persson, S.H.M.; Zirath, H.
- 作者Nawaz, M.; Strupinski, W.; Stenarson, J.; Persson, S.H.M.; Zirath, H.
- 文件大小648.52KB
- 发表时间1999
- DOI10.1109/relphy.1999.761600
- 页码103-109