SPIE Proceedings [SPIE Laser-Induced Damage in Optical Materials: 1998 - Boulder, CO (Monday 28 September 1998)] Laser-Induced Damage in Optical Materials: 1998 - Current 3-ω large optic test procedures and data analysis for the quality assurance of National Ignition Facility optics

Schwartz, Sheldon; Feit, Michael D.; Kozlowski, Mark R.; Mouser, Ron P.; Exarhos, Gregory J.; Guenther, Arthur H.; Kozlowski, Mark R.; Lewis, Keith L.; Soileau, M. J.

作者Schwartz, Sheldon; Feit, Michael D.; Kozlowski, Mark R.; Mouser, Ron P.; Exarhos, Gregory J.; Guenther, Arthur H.; Kozlowski, Mark R.; Lewis, Keith L.; Soileau, M. J.
卷第3578卷
印刷ISSN0277-786X
文件大小642.22KB
发表时间1999
DOI10.1117/12.344417
页码314-321

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SPIE Proceedings [SPIE Laser-Induced Damage in Optical Materials: 1998 - Boulder, CO (Monday 28 September 1998)] Laser-Induced Damage in Optical Materials: 1998 - Current 3-ω large optic test procedures and data analysis for the quality assurance of National Ignition Facility optics