Fabrication and characterization of chromium based single-electron transistors with evaporated chromium oxide barrier tunnel junctions
- 作者Y. A. Pashkin; J. P. Pekola; L. S. Kuzmin
- 文件大小428.13KB
- 发表时间1999
- DOI10.1116/1.590769
Collection mode nano-Raman setupA. Zavalin; A. Cricenti; R. Generosi; M. Luce; S. Morgan; D. Piston · 2005
Electrons on CdTe(110) surfaceB.J. Kowalski; B.A. Orlowski; A. Cricenti; P. Perfetti · 1995
Scanning near-field optical microscopy (SNOM)A. Cricenti · 2008
Electronic properties of SnSi(100) ordered interfacesM. Pedio; A. Cricenti · 1997
The GaSeSi(111) interface: a core level studyA. Amokrane; C.A. Sébenne; A. Cricenti; C. Ottaviani; F. Proix; M. Eddrief · 1998
PbSe(100) surface electronic states studied by surface differential reflectivityS. Colonna; F. Ronci; C. Ottaviani; A. Szczerbakow; B. J. Kowalski; B. A. Orlowski; A. Cricenti · 2003
New air operating scanning tunneling microscopeS. Selci; A. Cricenti; R. Generosi; E. Gori; G. Chiarotti · 1989
A novel tapping SNOM: Specifications and performancesG. Longo; M. Girasole; A. Cricenti · 2005