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On extended energy-loss fine structure data analysis for obtaining reliable structural parameters

On extended energy-loss fine structure data analysis for obtaining reliable structural parameters

Kobayashi, Y.; Muto, S.; Echer, C. J.; Tanabe, T.

期刊名称Journal of Electron Microscopy
作者Kobayashi, Y.; Muto, S.; Echer, C. J.; Tanabe, T.
卷第48卷
期第5期
印刷ISSN0022-0744
电子ISSN1477-9986
文件大小389.19KB
发表时间1999-01-01
DOI10.1093/oxfordjournals.jmicro.a023711
页码525-529

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