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SPIE Proceedings [SPIE AeroSense '99 - Orlando, FL (Monday 5 April 1999)] Optical Pattern Recognition X - <title>Nonlinear features for product inspection</title>

SPIE Proceedings [SPIE AeroSense '99 - Orlando, FL (Monday 5 April 1999)] Optical Pattern Recognition X - Nonlinear features for product inspection

Talukder, Ashit; Casasent, David P.; Casasent, David P.; Chao, Tien-Hsin

作者Talukder, Ashit; Casasent, David P.; Casasent, David P.; Chao, Tien-Hsin
卷第3715卷
印刷ISSN0277-786X
文件大小1281.00KB
发表时间1999
DOI10.1117/12.341305
页码32-43

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