Structural characteristics of multicomponent GaAs-InxGa1-xAs system from double-crystal X-ray diffractometry data
- 作者A. M. Afanas’ev; M. A. Chuev; R. M. Imamov; A. A. Lomov
- 卷第45卷
- 期第4期
- 印刷ISSN1063-7745
- 电子ISSN1562-689X
- 文件大小100.95KB
- 发表时间2000-07
- DOI10.1134/1.1306579
- 页码655-660