Scanning tunneling microscopy of the nonequilibrium interaction of impurity states at semiconductor surfaces
- 作者P. I. Arseev; N. S. Maslova; S. I. Oreshkin; V. I. Panov; S. V. Savinov
- 卷第72卷
- 期第11期
- 印刷ISSN0021-3640
- 电子ISSN1090-6487
- 文件大小129.96KB
- 发表时间2000-12
- DOI10.1134/1.1348482
- 页码565-568