On the segregation of Ca at SiO2/Si interface during oxygen ion bombardment
- 期刊名称Surface and Interface Analysis
- 作者Deenapanray, Prakash N. K.; Petravic, Mladen
- 卷第29卷
- 期第2期
- 印刷ISSN0142-2421
- 电子ISSN1096-9918
- 文件大小128.47KB
- 发表时间2000-02
- DOI10.1002/(sici)1096-9918(200002)29:2<160::aid-sia723>3.0.co;2-b
- 页码160-167
同期刊推荐
PrefaceGRANT, JOHN T. · Surface and Interface Analysis · 1997
PrefaceFriedbacher, Gernot; Fuchs, Harold; G�untherodt, Hans-Joachim · Surface and Interface Analysis · 1997
PrefaceMarkwitz, A.; Matz, W.; Waldschmidt, M.; Demortier, G. · Surface and Interface Analysis · 1998
Overlayer corrections in XPSZalm, P. C. · Surface and Interface Analysis · 1998
EditorialBriggs (Editor-in-Chief), David · Surface and Interface Analysis · 1998
PrefaceVanden Eynde, X.; Bertrand, P. · Surface and Interface Analysis · 1999
PrefaceBennewitz, R.; Meyer, E. · Surface and Interface Analysis · 1999
EditorialBriggs, David · Surface and Interface Analysis · 1999