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Scanning tunneling microscopy investigation of the C-terminated β-SiC(100) c(2×2) surface reconstruction: dimer orientation, defects and antiphase boundaries

Scanning tunneling microscopy investigation of the C-terminated β-SiC(100) c(2×2) surface reconstruction: dimer orientation, defects and antiphase boundaries

V. Derycke; P. Soukiassian; A. Mayne; G. Dujardin
  • 作者V. Derycke; P. Soukiassian; A. Mayne; G. Dujardin
  • 卷第446卷
  • 印刷ISSN0039-6028
  • 文件大小646.75KB
  • 发表时间2000
  • DOI10.1016/s0039-6028(99)01067-5
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