[IEEE 2000 International Symposium on Electromagnetic Compatibility (EMC 2000) - Washington, DC, USA (21-25 Aug. 2000)] IEEE International Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.00CH37016) - An improved method for determining normalized site attenuation using log periodic dipole arrays
Zhong Chen, ; Foegelle, M.
- 作者Zhong Chen, ; Foegelle, M.
- 卷第2卷
- 文件大小545.24KB
- 发表时间2000
- DOI10.1109/ISEMC.2000.874673
- 页码511-516