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[IEEE Comput. Soc 6th IEEE International On-Line Testing Workshop - Palma de Mallorca, Spain (3-5 July 2000)] Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) - Relation between fault tolerance and reconfiguration in cellular systems

[IEEE Comput. Soc 6th IEEE International On-Line Testing Workshop - Palma de Mallorca, Spain (3-5 July 2000)] Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) - Relation between fault tolerance and reconfiguration in cellular systems

Sekanina, L.; Drabek, V.

作者Sekanina, L.; Drabek, V.
文件大小163.77KB
发表时间2000
DOI10.1109/OLT.2000.856607
页码25-30

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