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[IEEE IEEE 2000 National Aerospace and Electronics Conference. NAECON 2000. Engineering Tomorrow - Dayton, OH, USA (10-12 Oct. 2000)] Proceedings of the IEEE 2000 National Aerospace and Electronics Conference. NAECON 2000. Engineering Tomorrow (Cat. No.00CH37093) - Ultrafast invariant face recognition

[IEEE IEEE 2000 National Aerospace and Electronics Conference. NAECON 2000. Engineering Tomorrow - Dayton, OH, USA (10-12 Oct. 2000)] Proceedings of the IEEE 2000 National Aerospace and Electronics Conference. NAECON 2000. Engineering Tomorrow (Cat. No.00CH37093) - Ultrafast invariant face recognition

Alam, M.S.; Al-Samman, A.R.

作者Alam, M.S.; Al-Samman, A.R.
文件大小602.00KB
发表时间2000
DOI10.1109/naecon.2000.894951
页码486-493

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