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[IEEE Comput. Soc 18th IEEE VLSI Test Symposium - Montreal, Que., Canada (30 April-4 May 2000)] Proceedings 18th IEEE VLSI Test Symposium - Cold delay defect screening

[IEEE Comput. Soc 18th IEEE VLSI Test Symposium - Montreal, Que., Canada (30 April-4 May 2000)] Proceedings 18th IEEE VLSI Test Symposium - Cold delay defect screening

Chao-Wen Tseng, ; Mccluskey, E.J.; Xiaoping Shao, ; Wu, D.M.

作者Chao-Wen Tseng, ; Mccluskey, E.J.; Xiaoping Shao, ; Wu, D.M.
文件大小81.32KB
发表时间2000
DOI10.1109/vtest.2000.843843
页码183-188

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