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[IEEE Comput. Soc 6th IEEE International On-Line Testing Workshop - Palma de Mallorca, Spain (3-5 July 2000)] Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) - An improved CMOS BICS for on-line testing

[IEEE Comput. Soc 6th IEEE International On-Line Testing Workshop - Palma de Mallorca, Spain (3-5 July 2000)] Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) - An improved CMOS BICS for on-line testing

Maidon, Y.; Deval, Y.; Begueret, J.B.

作者Maidon, Y.; Deval, Y.; Begueret, J.B.
文件大小110.37KB
发表时间2000
DOI10.1109/olt.2000.856620
页码100-103

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