[IEEE 2000 BIPOLAR/BiCMOS Circuits and Technology Meeting 2000 - Minneapolis, MN, USA (24-26 Sept. 2000)] Proceedings of the 2000 BIPOLAR/BiCMOS Circuits and Technology Meeting (Cat. No.00CH37124) - ESD robustness of a BiCMOS SiGe technology

Voldman, S.; Juliano, P.; Schmidt, N.; Botula, A.; Johnson, R.; Lanzerotti, L.; Feilchenfeld, N.; Joseph, J.; Malinowski, J.; Eld, E.; Gross, V.; Brennan, C.; Dunn, J.; Harame, D.; Herman, D.; Meyerson, B.

作者Voldman, S.; Juliano, P.; Schmidt, N.; Botula, A.; Johnson, R.; Lanzerotti, L.; Feilchenfeld, N.; Joseph, J.; Malinowski, J.; Eld, E.; Gross, V.; Brennan, C.; Dunn, J.; Harame, D.; Herman, D.; Meyerson, B.
文件大小458.11KB
发表时间2000
DOI10.1109/bipol.2000.886208
页码214-217

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[IEEE 2000 BIPOLAR/BiCMOS Circuits and Technology Meeting 2000 - Minneapolis, MN, USA (24-26 Sept. 2000)] Proceedings of the 2000 BIPOLAR/BiCMOS Circuits and Technology Meeting (Cat. No.00CH37124) - ESD robustness of a BiCMOS SiGe technology