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[IEEE Comput. Soc 18th IEEE VLSI Test Symposium - Montreal, Que., Canada (30 April-4 May 2000)] Proceedings 18th IEEE VLSI Test Symposium - Testability alternatives exploration through functional testing

[IEEE Comput. Soc 18th IEEE VLSI Test Symposium - Montreal, Que., Canada (30 April-4 May 2000)] Proceedings 18th IEEE VLSI Test Symposium - Testability alternatives exploration through functional testing

Ferrandi, F.; Ferrara, G.; Fornara, G.; Fummi, F.; Sciuto, D.

作者Ferrandi, F.; Ferrara, G.; Fornara, G.; Fummi, F.; Sciuto, D.
文件大小143.80KB
发表时间2000
DOI10.1109/vtest.2000.843874
页码423-428

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