发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE Comput. Soc 18th IEEE VLSI Test Symposium - Montreal, Que., Canada (30 April-4 May 2000)] Proceedings 18th IEEE VLSI Test Symposium - Integrating logic BIST in VLSI designs with embedded memories

[IEEE Comput. Soc 18th IEEE VLSI Test Symposium - Montreal, Que., Canada (30 April-4 May 2000)] Proceedings 18th IEEE VLSI Test Symposium - Integrating logic BIST in VLSI designs with embedded memories

Chickermane, V.; Richter, S.; Barnhart, C.

作者Chickermane, V.; Richter, S.; Barnhart, C.
文件大小189.52KB
发表时间2000
DOI10.1109/vtest.2000.843840
页码157-164

← 返回【学霸图书馆】主页