[IEEE International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM) - Smolenice, Slovakia (16-18 Oct. 2000)] ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386) - Peculiarities of Raman spectra from porous silicon
Korsunskaya, N.E.; Sheinkman, M.K.; Valakh, M.Ya.; Torchinskaya, T.V.; Khomenkova, L.Yu.; Yukhimchuk, V.A.; Bulakh, B.M.; Dzhumaev, M.K.; Many, A.; Goldstein, Y.; Savir, E.
- 作者Korsunskaya, N.E.; Sheinkman, M.K.; Valakh, M.Ya.; Torchinskaya, T.V.; Khomenkova, L.Yu.; Yukhimchuk, V.A.; Bulakh, B.M.; Dzhumaev, M.K.; Many, A.; Goldstein, Y.; Savir, E.
- 文件大小285.28KB
- 发表时间2000
- DOI10.1109/asdam.2000.889515
- 页码339-342