Direct characterization of terahertz radiation from the dynamics of the semiconductor surface field
Han, P. Y.; Huang, X. G.; Zhang, X.-C.
- 期刊名称Applied Physics Letters
- 作者Han, P. Y.; Huang, X. G.; Zhang, X.-C.
- 卷第77卷
- 期第18期
- 印刷ISSN0003-6951
- 文件大小294.67KB
- 发表时间2000
- DOI10.1063/1.1320866