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[Int. Test Conference International Test Conference 2000 - Atlantic City, NJ, USA (3-5 Oct. 2000)] Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) - Optimizing the flattened test-generation model for very large designs

[Int. Test Conference International Test Conference 2000 - Atlantic City, NJ, USA (3-5 Oct. 2000)] Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) - Optimizing the flattened test-generation model for very large designs

Wohl, P.; Waicukauski, J.

作者Wohl, P.; Waicukauski, J.
文件大小844.85KB
发表时间2000
DOI10.1109/test.2000.894263
页码681-690

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