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[IEEE Comput. Soc 6th IEEE International On-Line Testing Workshop - Palma de Mallorca, Spain (3-5 July 2000)] Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) - Power reduction in test-per-scan BIST

[IEEE Comput. Soc 6th IEEE International On-Line Testing Workshop - Palma de Mallorca, Spain (3-5 July 2000)] Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646) - Power reduction in test-per-scan BIST

Xiaodong Zhang, ; Roy, K.

作者Xiaodong Zhang, ; Roy, K.
文件大小293.04KB
发表时间2000
DOI10.1109/olt.2000.856625
页码133-138

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