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[IEEE Comput. Soc 18th IEEE VLSI Test Symposium - Montreal, Que., Canada (30 April-4 May 2000)] Proceedings 18th IEEE VLSI Test Symposium - Test generation for accurate prediction of analog specifications

[IEEE Comput. Soc 18th IEEE VLSI Test Symposium - Montreal, Que., Canada (30 April-4 May 2000)] Proceedings 18th IEEE VLSI Test Symposium - Test generation for accurate prediction of analog specifications

Voorakaranam, R.; Chatterjee, A.

作者Voorakaranam, R.; Chatterjee, A.
文件大小482.25KB
发表时间2000
DOI10.1109/VTEST.2000.843837
页码137-142

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