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[IEEE 17th IEEE Instrumentation and Measurement Technology Conference - Baltimore, MD, USA (1-4 May 2000)] Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066] - Metrological characterization of the square waveform as calibration signal for data acquisition systems

[IEEE 17th IEEE Instrumentation and Measurement Technology Conference - Baltimore, MD, USA (1-4 May 2000)] Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference [Cat. No. 00CH37066] - Metrological characterization of the square waveform as calibration signal for data acquisition systems

D'Antona, G.; Di Rienzo, L.; Ottoboni, R.

作者D'Antona, G.; Di Rienzo, L.; Ottoboni, R.
卷第2卷
文件大小305.37KB
发表时间2000
DOI10.1109/imtc.2000.848911
页码1077-1080

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