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[IEEE Comput. Soc 18th IEEE VLSI Test Symposium - Montreal, Que., Canada (30 April-4 May 2000)] Proceedings 18th IEEE VLSI Test Symposium - Fault escapes in duplex systems

[IEEE Comput. Soc 18th IEEE VLSI Test Symposium - Montreal, Que., Canada (30 April-4 May 2000)] Proceedings 18th IEEE VLSI Test Symposium - Fault escapes in duplex systems

Mitra, S.; Saxena, N.R.; McCluskey, E.J.

作者Mitra, S.; Saxena, N.R.; McCluskey, E.J.
文件大小157.51KB
发表时间2000
DOI10.1109/vtest.2000.843878
页码453-458

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