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[IEEE Comput. Soc 18th IEEE VLSI Test Symposium - Montreal, Que., Canada (30 April-4 May 2000)] Proceedings 18th IEEE VLSI Test Symposium - Delta Iddq for testing reliability

[IEEE Comput. Soc 18th IEEE VLSI Test Symposium - Montreal, Que., Canada (30 April-4 May 2000)] Proceedings 18th IEEE VLSI Test Symposium - Delta Iddq for testing reliability

Powell, T.J.; Pair, J.; St. John, M.; Counce, D.

作者Powell, T.J.; Pair, J.; St. John, M.; Counce, D.
文件大小51.58KB
发表时间2000
DOI10.1109/VTEST.2000.843876
页码439-443

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