SAE Technical Paper Series [SAE International SAE 2000 World Congress - (MAR. 06, 2000)] SAE Technical Paper Series - Diagnostic Technique for Impurities in Low Pressure Neon Lamps

• 作者Evans, Jean M.; Rothwell, Harold L.
• 卷第1卷
• 印刷ISSNArra-y
• 文件大小252.06KB
• 发表时间2000
• DOI10.4271/2000-01-0807