发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

$Characterization of a Quantum Well in an Si/Si1–xGex/Si Heterostructure by X-ray Diffractometry$

Characterization of a Quantum Well in an Si/Si1–xGex/Si Heterostructure by X-ray Diffractometry

A. M. Afanas'ev; A. P. Boltaev; R. M. Imamov; E. Kh. Mukhamedzhanov; M. M. Rzaev; M. A. Chuev

作者A. M. Afanas'ev; A. P. Boltaev; R. M. Imamov; E. Kh. Mukhamedzhanov; M. M. Rzaev; M. A. Chuev
卷第31卷
期第1期
印刷ISSN1063-7397
电子ISSN1608-3415
文件大小45.85KB
发表时间2001-01
DOI10.1023/a:1013804121018
页码1-6

← 返回【学霸图书馆】主页