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[IEEE 2001 IEEE Industry Applications Society 36th Annual Meeting - IAS'01 - Chicago, IL, USA (30 Sept.-4 Oct. 2001)] Conference Record of the 2001 IEEE Industry Applications Conference. 36th IAS Annual Meeting (Cat. No.01CH37248) - Parameter-measurement and control of the synchronous reluctance machine including cross saturation

[IEEE 2001 IEEE Industry Applications Society 36th Annual Meeting - IAS'01 - Chicago, IL, USA (30 Sept.-4 Oct. 2001)] Conference Record of the 2001 IEEE Industry Applications Conference. 36th IAS Annual Meeting (Cat. No.01CH37248) - Parameter-measurement and control of the synchronous reluctance machine including cross saturation

Kilthau, A.; Pacas, J.M.

作者Kilthau, A.; Pacas, J.M.
卷第4卷
文件大小1070.83KB
发表时间2001
DOI10.1109/ias.2001.955945
页码2302-2309

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