Sensitivity Analysis for Nonrandom Dropout: A Local Influence Approach
Geert Verbeke, Geert Molenberghs, Herbert Thijs, Emmanuel Lesaffre and Michael G. Kenward
- 期刊名称Biometrics
- 作者Geert Verbeke, Geert Molenberghs, Herbert Thijs, Emmanuel Lesaffre and Michael G. Kenward
- 卷第57卷
- 期第1期
- 印刷ISSN0006-341X
- 电子ISSN1541-0420
- 文件大小1408.17KB
- 发表时间2001-03
- DOI10.2307/2676836
- 页码7-14