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[IEEE Comput. Soc 2001 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (6-7 Aug. 2001)] Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing - Testing carry logic modules of SRAM-based FPGAs

[IEEE Comput. Soc 2001 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (6-7 Aug. 2001)] Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing - Testing carry logic modules of SRAM-based FPGAs

Xiaoling Sun, ; Jian Xu, ; Trouborst, P.

作者Xiaoling Sun, ; Jian Xu, ; Trouborst, P.
文件大小680.07KB
发表时间2001
DOI10.1109/MTDT.2001.945235
页码91-98

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