[IEEE 57th ARFTG Conference Digest - Phoenix, AZ, USA (2001.05.25-2001.05.25)] 57th ARFTG Conference Digest - Characteristic Impedance Extraction Using Calibration Comparison
- 作者Vandenberghe, S.; Schreurs, D.; Carchon, G.; Nauwelaers, B.; de Raedt, W.
- 文件大小225.56KB
- 发表时间2001
- DOI10.1109/arftg.2001.327474
- 页码1-4
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