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[JEDEC GaAs Reliability Workshop. - Baltimore, MD, USA (21 Oct. 2001)] 2001 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.01TH8602) - Effect of gate metal on reliability of metamorphic HEMTs

[JEDEC GaAs Reliability Workshop. - Baltimore, MD, USA (21 Oct. 2001)] 2001 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.01TH8602) - Effect of gate metal on reliability of metamorphic HEMTs

Dammann, M.; Leuther, A.; Konstanzer, H.; Jantz, W.

作者Dammann, M.; Leuther, A.; Konstanzer, H.; Jantz, W.
文件大小172.21KB
发表时间2001
DOI10.1109/gaasrw.2001.995734
页码87-88

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