Embedded DRAM development: Technology, physical design, and application issues
- 期刊名称IEEE Design & Test of Computers
- 作者Keitel-Schulz, D.; Wehn, N.
- 卷第18卷
- 期第3期
- 印刷ISSN0740-7475
- 文件大小196.87KB
- 发表时间2001
- DOI10.1109/54.922799
- 页码7-15
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