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Direct observation of a critical length effect in dual-damascene Cu/oxide interconnects

Direct observation of a critical length effect in dual-damascene Cu/oxide interconnects

Ogawa, Ennis T.; Bierwag, Alexander J.; Lee, Ki-Don; Matsuhashi, Hideki; Justison, Patrick R.; Ramamurthi, Anup N.; Ho, Paul S.; Blaschke, Volker A.; Griffiths, David; Nelsen, Anne; Breen, Mark; Havemann, Robert H.
  • 期刊名称Applied Physics Letters
  • 作者Ogawa, Ennis T.; Bierwag, Alexander J.; Lee, Ki-Don; Matsuhashi, Hideki; Justison, Patrick R.; Ramamurthi, Anup N.; Ho, Paul S.; Blaschke, Volker A.; Griffiths, David; Nelsen, Anne; Breen, Mark; Havemann, Robert H.
  • 卷第78卷
  • 期第18期
  • 印刷ISSN0003-6951
  • 文件大小575.38KB
  • 发表时间2001
  • DOI10.1063/1.1365414
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