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[IEEE International Test Conference - Baltimore, MD, USA (30 Oct.-1 Nov. 2001)] Proceedings International Test Conference 2001 (Cat. No.01CH37260) - Test wrapper and test access mechanism co-optimization for system-on-chip

[IEEE International Test Conference - Baltimore, MD, USA (30 Oct.-1 Nov. 2001)] Proceedings International Test Conference 2001 (Cat. No.01CH37260) - Test wrapper and test access mechanism co-optimization for system-on-chip

Iyengar, V.; Chakrabarty, K.; Marinissen, E.J.

作者Iyengar, V.; Chakrabarty, K.; Marinissen, E.J.
文件大小1323.72KB
发表时间2001
DOI10.1109/test.2001.966728
页码1023-1032

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