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[IEEE Comput. Soc 2001 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (6-7 Aug. 2001)] Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing - A method to calculate redundancy coverage for FLASH memories

[IEEE Comput. Soc 2001 IEEE International Workshop on Memory Technology, Design and Testing - San Jose, CA, USA (6-7 Aug. 2001)] Proceedings 2001 IEEE International Workshop on Memory Technology, Design and Testing - A method to calculate redundancy coverage for FLASH memories

Matarress, S.; Fasoli, L.

作者Matarress, S.; Fasoli, L.
文件大小220.02KB
发表时间2001
DOI10.1109/mtdt.2001.945226
页码41-44

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