Fluctuon type carrier localization near charged defect
- 期刊名称Ferroelectrics
- 作者Glinchuk, M. D.; Kuzian, R. O.; Laguta, V. V.; Nokhrin, S. N.; Bykov, I. P.
- 卷第254卷
- 期第1期
- 印刷ISSN0015-0193
- 电子ISSN1563-5112
- 文件大小475.98KB
- 发表时间2001-03
- DOI10.1080/00150190108215013
- 页码337-347
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