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Characterization of thin indium tin oxide films deposited by pulsed XeCl laser ablation

Characterization of thin indium tin oxide films deposited by pulsed XeCl laser ablation

M. Martino; A. Luches; M. Fernández; P. Anobile; V. Petruzzelli

作者M. Martino; A. Luches; M. Fernández; P. Anobile; V. Petruzzelli
文件大小119.52KB
发表时间2001
DOI10.1088/0022-3727/34/17/306

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