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Study of vacancy-type defects after Cu diffusion in GaAs

Study of vacancy-type defects after Cu diffusion in GaAs

V. Bondarenko; K. Petters; R. Krause-Rehberg; J. Gebauer; H.S. Leipner

作者V. Bondarenko; K. Petters; R. Krause-Rehberg; J. Gebauer; H.S. Leipner
印刷ISSN0921-4526
文件大小154.85KB
发表时间2001
DOI10.1016/s0921-4526(01)00805-5
页码792-795

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