SPIE Proceedings [SPIE Lasers in Metrology and Art Conservation - Munich, Germany (Monday 18 June 2001)] Microsystems Engineering: Metrology and Inspection - Mechanical properties of polarimetric smart structures
- 作者Konopka, Witold; Wolinski, Tomasz R.; Dymny, Grzegorz; Gorecki, Christophe; Jueptner, Werner P. O.; Kujawinska, Malgorzata
- 卷第4400卷
- 印刷ISSN0277-786X
- 文件大小411.69KB
- 发表时间2001
- DOI10.1117/12.445601
- 页码170-174
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