SPIE Proceedings [SPIE Lasers in Metrology and Art Conservation - Munich, Germany (Monday 18 June 2001)] Microsystems Engineering: Metrology and Inspection - Microphotogrammetry for 3D strain measurement and microassembly control
- 作者Tutsch, Rainer; Ritter, Reinhold; Ispas, Diana; Petz, Marcus; Casarotto, Leobaldo; Gorecki, Christophe; Jueptner, Werner P. O.; Kujawinska, Malgorzata
- 卷第4400卷
- 印刷ISSN0277-786X
- 文件大小965.34KB
- 发表时间2001
- DOI10.1117/12.445602
- 页码27-35
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