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Identification and fine tuning of closed-loop processes under discrete EWMA and PI adjustments

Identification and fine tuning of closed-loop processes under discrete EWMA and PI adjustments

Rong Pan; Enrique del Castillo
  • 作者Rong Pan; Enrique del Castillo
  • 卷第17卷
  • 期第6期
  • 印刷ISSN0748-8017
  • 电子ISSN1099-1638
  • 文件大小142.68KB
  • 发表时间2001
  • DOI10.1002/qre.424
  • 页码419-427
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