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$Structural characterization of Si1 −xGexultrathin quantum wells in a Si matrix by high-resolution X-ray diffraction$

Structural characterization of Si1 −xGexultrathin quantum wells in a Si matrix by high-resolution X-ray diffraction

A. M. Afanas’ev; M. A. Chuev; R. M. Imamov; É. Kh. Mukhamedzhanov; M. M. Rzaev; F. Schäffler; M. Müehlberger

作者A. M. Afanas’ev; M. A. Chuev; R. M. Imamov; É. Kh. Mukhamedzhanov; M. M. Rzaev; F. Schäffler; M. Müehlberger
卷第47卷
期第6期
印刷ISSN1063-7745
电子ISSN1562-689X
文件大小67.79KB
发表时间2002-11
DOI10.1134/1.1523527
页码1058-1062

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