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Are false memories more difficult to forget than accurate memories? The effect of retention interval on recall and recognition

Are false memories more difficult to forget than accurate memories? The effect of retention interval on recall and recognition

John G. Seamon; Chun R. Luo; Jonathan J. Kopecky; Catherine A. Price; Leeatt Rothschild; Nicholas S. Fung; Michael A. Schwartz
  • 作者John G. Seamon; Chun R. Luo; Jonathan J. Kopecky; Catherine A. Price; Leeatt Rothschild; Nicholas S. Fung; Michael A. Schwartz
  • 卷第30卷
  • 期第7期
  • 印刷ISSN0090-502X
  • 电子ISSN1532-5946
  • 文件大小161.91KB
  • 发表时间2002-10
  • DOI10.3758/bf03194323
  • 页码1054-1064
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