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[IEEE 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual - Dallas, TX, USA (7-11 April 2002)] 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) - Techniques for reliability analysis of MEMS RF switch

[IEEE 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual - Dallas, TX, USA (7-11 April 2002)] 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) - Techniques for reliability analysis of MEMS RF switch

DeNatale, J.; Mihailovich, R.; Waldrop, J.

作者DeNatale, J.; Mihailovich, R.; Waldrop, J.
文件大小172.03KB
发表时间2002
DOI10.1109/relphy.2002.996620
页码116-117

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