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Test generation and testability alternatives exploration of critical algorithms for embedded applications

Test generation and testability alternatives exploration of critical algorithms for embedded applications

Ferrandi, F.; Fummi, F.; Sciuto, D.

作者Ferrandi, F.; Fummi, F.; Sciuto, D.
卷第51卷
期第2期
文件大小483.32KB
发表时间2002
DOI10.1109/12.980008
页码200-215

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